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Contents
Advances in Scanning Probe Microscopy
This book covers several of the most important topics of current interest at the forefront of scanning probe microscopy. These include a realistic theory of atom-resolving atomic force microscopy (AFM), fundamentals of MBE growth of III-V compound semiconductors and atomic manipulation for future single-electron devices.
Theory of Scanning Probe Microscopy * First-Principles Electronic Structure Theory for Semiconductor Surfaces * Atomic Structure of 6H-SiC * Application of Atom Manipulation for Fabricating Nanoscale and Atomic-scale Structures on Si Surfaces * Theoretical Insights into Fullerenes Absorbed on Surfaces: Comparison with STM Studies * Apparent Barrier Height and Barrier-Height Imaging of Surfaces * Mesoscopic Work Function Measurement by Scanning Tunneling Microscope * Scanning Tunneling Microscopy of III-V Compound Semiconductor (001) Surfaces * Adsorption of Fullerenes on Semiconductor and Metal Surfaces Investigated by Field-Ion Scanning Microscopy.
Specifications
| Pm Supplier | Springer Verlag |
|---|---|
| Pm Publisher | Springer Nature |
| Pm Isbn 10 | 3540667180 |
| Pm Isbn 13 | 9783540667186 |
| Pm Publication Date | 2000-03-27 |
| Pm Width | 162 |
| Pm Author | Sakurai, T, Watanabe |
| Pm Height | 21 |
| Pm Longness | 230 |
- Author: Sakurai, T, Watanabe
- Page Count: 341
Advances in Scanning Probe Microscopy
£89.99
£89.99
ex. VAT
ex. VAT
SKU: 104404
- Author: Sakurai, T, Watanabe
- Page Count: 341
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