Contents
Electron lens; generation and control of the electron beam; properties of an electron wave; electron diffraction; imaging mechanism for transmission electron microscopy; resolution limit due to the coherence degree of electron waves; how to observe and analyze HRTEM images; application of HRTEM for analyzing high-Tc.
Specifications
| Pm Supplier | Elsevier Books Ltd *** |
|---|---|
| Pm Publisher | North-Holland |
| Pm Isbn 10 | 044488744X |
| Pm Isbn 13 | 9780444887443 |
| Pm Publication Date | 1994-12-31 |
| Pm Width | 0 |
| Pm Author | Horiuchi, S |
| Pm Height | 0 |
| Pm Longness | 0 |
- Author: Horiuchi, S
- Page Count: 358
Fundamentals of High-Resolution Transmission Electron Microscopy
£158.00
£158.00
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ex. VAT
SKU: 84664
- Author: Horiuchi, S
- Page Count: 358
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