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Contents
Introduction to Scanning Transmission Electron Microscopy
Scanning Transmission Electron Microscopy (STEM) is one of the highest resolution methods for performing microanalysis on thin sections of material. The technique is used in many modern transmission electron microscopes and an increasing number of special
Why STEM? - STEM versus TEM; STEM Optics; The specimen; Imaging in the STEM; Diffraction in the STEM; Microanalysis in the STEM; Mapping in the STEM; Limits to STEM and advanced STEM; Glossary; Further reading; Index
Specifications
| Pm Supplier | Hachette UK / Taylor & Francis / Informa UK Ltd 70000065 |
|---|---|
| Pm Publisher | BIOS Scientific Publishers |
| Pm Isbn 10 | 1859960669 |
| Pm Isbn 13 | 9781859960660 |
| Pm Publication Date | 1997-06-15 |
| Pm Width | 156 |
| Pm Author | Keyse, RJ, Garratt-Reed, AJ, Goodhew, PJ, Lorimer, GW |
| Pm Height | 7 |
| Pm Longness | 234 |
- Author: Keyse, RJ, Garratt-Reed, AJ, Goodhew, PJ, Lorimer, GW
- Page Count: 114
Introduction to Scanning Transmission Electron Microscopy
£87.99
£87.99
ex. VAT
ex. VAT
SKU: 82272
- Author: Keyse, RJ, Garratt-Reed, AJ, Goodhew, PJ, Lorimer, GW
- Page Count: 114
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