About this product
Specifications
Scanning Electron Microscopy
Scanning Electron Microscopy provides a description of the physics of electron-probe formation and of electron-specimen interactions. The different imaging and analytical modes using secondary and backscattered electrons, electron-beam-induced currents, X-ray and Auger electrons, electron channelling effects, and cathodoluminescence are discussed to evaluate specific contrasts and to obtain quantitative information.
| Pm Supplier | Springer Verlag |
|---|---|
| Pm Publisher | Springer Nature |
| Pm Isbn 10 | 3540639764 |
| Pm Isbn 13 | 9783540639763 |
| Pm Publication Date | 1998-09-17 |
| Pm Author | Reimer, L |
| Pm Longness | 0 |
- Author: Reimer, L
- Page Count: 510
Scanning Electron Microscopy
£307.00
£307.00
ex. VAT
ex. VAT
SKU: 86781
- Author: Reimer, L
- Page Count: 510
Customer Reviews
Not yet reviewed
/5
Review this product